The scanning electron microscope (SEM) is an advanced analytical tool with broad application to failure analysis, troubleshooting and quality control. Access to an SEM is normally on a contract arrangement with a local metallurgical lab or post-secondary education institute. Understanding the strengths, limitations and analytical capabilities of an SEM provides a basis for obtaining maximum value from the service. A variety of specific techniques that apply to precious metals is outlined. Sample preparation, defect identification and provision of analysis standards require careful attention to detail. Numberous illustrated examples of SEM techniques from past and present Symposia emphasize applicability to jewelry related issues.

Author: Greg Normandeau